B. Erdem Alaca Department of Mechanical Engineering Koç University, Istanbul TURKEY

Accessing the nanoscale: Silicon nanowires in monolithic miniaturization, automated testing and multiscale modeling

Monolithic systems integration is explored from three key perspectives in the context of piezoresistive silicon nanowires: i) their potential to serve as a batch-compatible interface to the nanoscale, leading to substantial miniaturization and enhanced sensitivity in electromechanical sensor platforms operating across multiple scales; ii) their compatibility with automated testing, which is an essential tool for generating large datasets under consistent conditions; and iii) data interpretation through multiscale modeling and machine learning, aimed at understanding the significant variability in reported properties across the literature. The principles and techniques discussed in this talk are readily applicable to other nanoscale building blocks.