Yuen Yong

Associate Professor
School of Electrical Engineering and Computing
University of Newcastle, Callaghan

High-performance Atomic Force Microscopy

The impact of Atomic Force Microscopy (AFM) has extended beyond topography imaging. For example, AFM has been used to measure the local stiffness of biomaterials. The rapid growing and ever-increasing applications of nanotechnology have increased the demand for a high-performance AFM. This talk will present challenges in design and control of different AFM components to improve performances such as scan speeds and image quality.